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Cover image for book C, H, N and O in Si and Characterization and Simulation of Materials and Processes

C, H, N and O in Si and Characterization and Simulation of Materials and Processes

By:Borghesi, A.; Gösele, U.M.; Vanhellemont, J.; Gué, A.M.; Djafari-Rouhani, M.
Publisher:Elsevier S & T
Print ISBN:9780444824134
eText ISBN:9780444596338
Edition:0
Format:Page Fidelity

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