Applied Logistic Regression
| By: | David W. Hosmer, Jr.; Stanley Lemeshow; Rodney X. Sturdivant |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9780470582473 |
| eText ISBN: | 9781118548394 |
| Edition: | 3 |
| Format: | Page Fidelity |
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