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Cover image for book Modern Characterization of Electromagnetic Systems and its Associated Metrology

Modern Characterization of Electromagnetic Systems and its Associated Metrology

By:Tapan K. Sarkar; Magdalena Salazar-Palma; Ming Da Zhu; Heng Chen
Publisher:Wiley Professional Development (P&T)
Print ISBN:9781119076469
eText ISBN:9781119076537
Edition:1
Format:Reflowable

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