Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
| By: | Bowen, W. Richard; Hilal, Nidal |
| Publisher: | Elsevier S & T |
| Print ISBN: | 9781856175173 |
| eText ISBN: | 9780080949574 |
| Edition: | 0 |
| Format: | Page Fidelity |
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